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agilent 86100C wide-bandwidth oscilloscope mainframe and modules technical speci? cations dca-j ? accurate compliance testing of optical transceivers ? automated jitter and amplitude interference decomposition ? internally generated pattern trigger ? modular platform for testing waveforms to 40 gb/s and beyond ? broadest coverage of data rates with optical reference receivers, electrical channels, and clock recovery ? built-in s-parameters with tdr measurements ? compatible with agilent 86100a/b-series, 83480a-series,and 54750-series modules ? < 90 fs intrinsic jitter ? open operating system C windows ? xp pro four instruments in one a digital communications analyzer, a full featured wide-bandwidth oscilloscope, a time-domain re? ectometer, and a jitter analyzer
2 overview features 3 eye-diagram/mask test 4 jitter analysis 5 equalization and amplitude analysis 6 jitter spectrum/pll bandwidth 7 tdr/tdt/s-parameters 7 measurements 8 additional capabilities 9 clock recovery 10 speci? cations mainframe & triggering (includes precision time base module and precision waveform analyzer module) 13 computer system & storage 16 modules overview 17 module selection table 18 speci? cations multimode/single-mode 19 single-mode 21 dual electrical 23 tdr 25 clock recovery 27 ordering information 29 table of contents
3 overview of in? niium dca-j features four instruments in one the 86100C in? niium dca-j can be viewed as four high-powered instruments in one: ? a general-purpose wide-bandwidth sampling oscilloscope. patternlock triggering signi? cantly enhances the usability as a general purpose scope. ? a digital communications analyzer ? a time domain re? ectometer ? a precision jitter and amplitude interference analyzer just select the desired instrument mode and start making measurements. con? gurable to meet your needs the 86100C supports a wide range of modules for testing both optical and electrical signals. select modules to get the speci? c bandwidth, ? ltering, and sensitivity you need. digital communications analysis accurate eye-diagram analysis is essential for characterizing the quality of transmitters used from 100 mb/s to 40 gb/s. the 86100C is designed speci? cally for the complex task of analyzing digital communications waveforms. compliance mask and parametric testing no longer require a complicated sequence of setups and con? gurations. if you can press a button, you can perform a complete compliance test. the important measurements you need are right at your ? ngertips, including: ? industry standard mask testing with built-in margin analysis ? extinction ratio measurements with accuracy and repeatability ? eye measurements: crossing %, eye height and width, 1 and 0 levels, jitter, rise or fall times and more the key to accurate measurements of lightwave communications waveforms is the optical receiver. the 86100C has a broad range of precision receivers integrated within the instrument. ? built-in photodiodes, with ? at frequency responses, yield the highest waveform ? delity. this provides high accuracy for extinction ratio measurements. ? standards-based transmitter compliance measurements require ? ltered responses. the 86100C offers a broad range of ? lter combinations. filters can be automatically and repeatably switched in or out of the measurement channel remotely over gpib or with a front panel button. the frequency response of the entire measurement path is calibrated, and will maintain its performance over long-term usage. ? the integrated optical receiver provides a calibrated optical channel. with the accurate optical receiver built into the module, optical signals are accurately measured and displayed in optical power units. ? switches or couplers are not required for an average power measurement. signal routing is simpli? ed and signal strength is maintained. windows is a u.s. registered trademark of microsoft corporation.
4 eye diagram mask testing the 86100C provides ef? cient, high-throughput waveform compliance testing with a suite of standards based eye-diagram masks. the test process has been streamlined into a minimum number of keystrokes for testing at industry standard data rates. standard formats rate (mb/s) 1x gigabit ethernet 1250 2x gigabit ethernet 2500 10 gigabit ethernet 9953.28 10 gigabit ethernet 10312.5 10 gigabit ethernet fec 11095.7 10 gigabit ethernet lx4 3125 fibre channel 1062.5 2x fibre channel 2125 4x fibre channel 4250 8x fibre channel 8500 10x fibre channel 10518.75 10x fibre channel fec 11317 16x fibre channel 14025 in? niband 2500 stm0/oc1 51.84 stm1/oc3 155.52 stm4/oc12 622.08 stm16/oc48 2488.3 stm16/oc48 fec 2666 stm64/oc192 9953.28 stm64/oc192 fec 10664.2 stm64/oc192 fec 10709 stm64/oc192 super fec 12500 stm256/oc768 39813 sts1 eye 51.84 sts3 eye 155.52 other eye-diagram masks are easily created through scaling those listed above. in addition, mask editing allows for new masks either by editing existing masks, or creating new masks from scratch. a new mask can also be created or modi? ed on an external pc using a text editor such as notepad, then can be transferred to the instruments hard drive using lan or flash drive. perform these mask conformance tests with convenient user-de? nable measurement conditions, such as mask margins for guardband testing, number of waveforms tested, and stop/limit actions. mask margin can be determined automatically to a user de? nable hit/error ratio. transmitter waveform dispersion penalty (twdp) tests can be performed directly in the 86100C. exporting the waveform for external post processing is not required. (option 201 and matlab? required. dispersion penalty script for speci? c test standards must be loaded into the 86100C.) eyeline mode eyeline mode is available in the 86100C and provides insight into the effects of speci? c bit transitions within a data pattern. the unique view assists diagnosis of device or system failures due to speci? c transitions or sets of transitions within a pattern. when combined with mask limit tests, eyeline mode can quickly isolate the speci? c bit that caused a mask violation. traditional triggering methods on an equivalent time sampling scope are quite effective at generating eye diagrams. however, these eye diagrams are made up of samples whose timing relationship to the data pattern is effectively random, so a given eye will be made up of samples from many different bits in the pattern taken with no speci? c timing order. the result is that amplitude versus time trajectories of speci? c bits in the pattern are not visible. also, averaging of the eye diagram is not valid, as the randomly related samples will effectively average to the middle of the eye. eyeline mode uses patternlock triggering (option 001 required) to build up an eye diagram from samples taken sequentially through the data pattern. this maintains a speci? c timing relationship between samples and allows eyeline mode to draw the eye based on speci? c bit trajectories. effects of speci? c bit transitions can be investigated, and averaging can be used with the eye diagram. patternlock triggering advances the capabilities of the sampling oscilloscope the enhanced trigger option (option 001) on the 86100C provides a fundamental capability never available before in an equivalent time sampling oscilloscope. this new triggering mechanism enables the dca-j to generate a trigger at the repetition of the input data pattern C a pattern trigger. historically, this required the pattern source to provide this type of trigger to the scope. with the press of a button, patternlock automatically detects the pattern length, data rate and clock rate making the complex triggering process transparent to the user. patternlock enables the 86100C to behave more like a real-time oscilloscope in terms of user experience. observation of speci? c bits within the data pattern is greatly simpli? ed. users that are familiar with real-time oscilloscopes, but perhaps less so with equivalent time sampling scopes will be able to ramp up quickly. patternlock adds another new dimension to pattern triggering by enabling the mainframe software to take samples at speci? c locations in the data pattern with outstanding timebase accuracy. this capability is a building block for many of the new capabilities available in the 86100C described later. matlab ? is a registered trademark of the mathworks, inc.
5 jitter analysis (option 200) the j in dca-j represents the ability to perform jitter analysis. the 86100C is a digital communications analyzer with jitter analysis capability. the 86100C adds a fourth mode of operation C jitter mode. extremely wide bandwidth, low intrinsic jitter, and advanced analysis algorithms yield the highest accuracy in jitter measurements. as data rates increase in both electrical and optical applications, jitter is an ever increasing measurement challenge. decomposition of jitter into its constituent components is becoming more critical. it provides critical insight for jitter budgeting and performance optimization in device and system designs. many communications standards require jitter decomposition for compliance. traditionally, techniques for separation of jitter have been complex and often dif? cult to con? gure, and availability of instruments for separation of jitter becomes limited as data rates increase. the dca-j provides simple, one button setup and execution of jitter analysis. jitter mode decomposes jitter into its constituent components and presents jitter data in various insightful displays. jitter mode operates at all data rates the 86100C supports, removing the traditional data rate limitations from complex jitter analysis. the 86100C provides several key attributes to jitter analysis: ? very low intrinsic jitter (both random and deterministic) translates to a very low jitter noise ? oor which provides unmatched jitter measurement sensitivity. ? wide bandwidth measurement channels deliver very low intrinsic data dependent jitter and allow analysis of jitter on all data rates to 40 gb/s and beyond. ? patternlock triggering technology provides sampling ef? ciency that makes jitter measurements very fast. ? firmware revision 8.0 allows for accurate jitter measurements on signals with large rj/pj components (up to 0.7 ui). jitter analysis functionality is available through the option 200 software package. option 200 includes: ? decomposition of jitter into total jitter (tj), random jitter (rj), deterministic jitter (dj), periodic jitter (pj), data dependent jitter (ddj), duty cycle distortion (dcd), and jitter induced by intersymbol interference (isi). ? various graphical and tabular displays of jitter data ? export of jitter data to convenient delimited text format ? save / recall of jitter database ? jitter frequency spectrum ? isolation and analysis of sub-rate jitter (srj), that is, periodic jitter that is at an integer sub-rate of the bitrate. ? bathtub curve display in both q and logber scale ? adjustable total jitter probability advanced eye analysis (option 401) accurate jitter measurements on long patterns when testing jitter performance against speci? cations, some standards, such as 10 gigabit ethernet, often make use of long patterns such as prbs31. longer patterns emulate actual data traf? c more accurately and can uncover more problems within a device. however, these long patterns can be a challenge for many instruments that measure jitter and estimate total jitter (tj). 86100Cu-401 addresses this challenge by making compliant jitter measurements on long patterns, such as prbs31 or live traf? c. using powerful jitter analysis algorithms, the software measures rj, dj, and calculates estimated tj, on electrical or optical signals. additionally, the application measures high probability jitter such as j2 jitter, sometimes referred to as 99% jitter or all but 1% of jitter. it also measures j9 jitter, de? ned at a ber of 2.5e-10. data dependent pulse width shrinkage (ddpws), a component of data dependent jitter (ddj), is also reported when the 86100C dca-j is equipped with 86100C-200 enhanced jitter analysis. compliant mask testing using ber contours another feature of 86100Cu-401 is its ability to perform mask testing using speci? cations ber-contours. this method of mask testing is used when speci? cations, such as oif-cei 2.0 and xfp, de? ne mask test requirements based on a de? ned bit error ratio for the link. while this type of mask can be modi? ed and tested using conventional mask testing techniques, the 86100C can now perform compliant mask testing using both methods. sampling scopes, due to their unmatched signal ? delity, are the de facto standard for mask testing. flexible hardware con? guration the software application runs on an external pc, or 86100C dca-j, running microsoft? of? ce excel 2003/2007. it uses any 86100C dca-j hardware con? guration to perform a precision waveform measurement and imports the data into ms excel for further processing. when performing jitter measurements on high performance devices (rj < 500fs), the application is able to leverage 86100C-200 enhanced jitter (jitter mode), well known for its speed and accuracy. alternatively, the application can also operate standalone if jitter mode is not installed - the choice is yours!
6 equalization and advanced waveform analysis (option 201) as bit rates increase, channel effects cause signi? cant eye closure. many new devices and systems are employing equalization and pre/de-emphasis to compensate for channel effects. option 201 advanced waveform analysis will provide key tools to enable design, test, and modeling of devices and systems that must deal with dif? cult channel effects: ? capture of long single valued waveforms. patternlock triggering and the waveform append capability of option 201 enable very accurate pulse train data sets up to 256 megasamples long, similar to a very deep memory real-time oscilloscope acquisition. ? equalization. the dca-j can take a long single valued waveform and route it through a linear equalizer algorithm (default or user de? ned) and display the resultant equalized waveform in real time. the user can simultaneously view the input (distorted) and output (equalized) waveforms. ? interface to matlab? 1 analysis capability. user can de? ne a measurement with a matlab? script. result can be reported on oscilloscope results display. ? automatic dispersion penalty analysis (such as transmitter waveform dispersion penalty or twdp). user-entered matlab? scripts used to automatically process waveforms and determine penalty values. advanced amplitude analysis/rin/q-factor (option 300) in addition to jitter, signal quality can also be impacted by impairments in the amplitude domain. similar to the many types of jitter that exist, noise, inter-symbol interference, and periodic ? uctuation can cause eye closure in the amplitude domain. option 300 can be added to an 86100C mainframe (option 200 must also be installed) to provide in-depth analysis of the quality of both the zero and one levels of nrz digital communications signals. amplitude analysis is performed at a single button press as part of the jitter mode measurement process. ? measurement results are analogous to those provided for jitter and include total interference (ti), deterministic interference (dual-dirac model, di), random noise (rn), periodic interference (pi), and inter-symbol interference (isi) ? tablular and graphical results for both one and zero levels ? export of interference data to delimited text format ? save/recall of interference database ? interference frequency spectrum ? bathtub curve display ? q-factor (isolated from deterministic interference) ? adjustable probability for total interference estimation relative intensity noise (rin) relative intensity noise (rin) describes the effects of laser intensity ? uctuations on the recovered electrical signal. like amplitude interference, excessive rin can close the eye diagram vertically, and therefore affect the power budget or system performance. the dca-j can measure rin on square wave as well as industry- standard prbs and other patterns. in order to avoid having the measurement in? uenced by inter-symbol interference, the instrument searches the pattern for sequences of consecutive bits (for example, ? ve zeroes or ? ve ones) and measures the random noise and the power levels in the center of this sequence. when a reference receiver ? lter is turned on rin is normalized to a 1 hz bandwidth. the user can also choose between rin based on the one level or on the optical modulation amplitude (rin oma according to ieee 802.3ae). rin measurements require options 001, 200, and 300. 1. matlab software is available from agilent with the purchase of a new dca-j as option 061 or option 062, depending on the toolboxes you need. matlab can also be purchased separately from the mathworks, inc. (www.mathworks.com). if users wish to run matlab on the 86100C mainframe, they must purchase matlab 2008a or an earlier version. please see www.agilent.com/? nd/matlab_oscilloscopes for more information.
7 phase noise/jitter spectrum analysis analysis of jitter in the frequency domain can provide valuable insight into jitter properties and the root causes behind them. the phase locked-loop of the 83496b clock recovery module or 86108a precision waveform analyzer module can effectively be used as a jitter demodulator. internally monitoring the loop error signal and transforming it into the frequency domain allows the jitter spectrum of a signal to be observed. through self-calibration, effects of the loop response are removed from the observed signal, allowing accurate jitter spectral analysis over a 300 hz to 20 mhz span. this technique provides measurements not available with other test solutions: ? jitter spectrum/phase noise for both clock or data signals ? display in seconds or dbc/hz ? high sensitivity: for input signals > 0.5 vpp, < C100 dbc/hz at 10 khz offset for 5 gb/s, C106 dbc/hz for 2.5 gb/s, C140 dbc/hz at 20 mhz offset (integrated spectrum of the instrument jitter from 10 khz to 20 mhz is less than 100 fs) ? high dynamic range: can lock onto and display signals with > 0.5% pp frequency deviation such as spread spectrum clocks and data ? data rates from 50 mb/s to 14.2 gb/s ? clock rates from 25 mhz to 6.75 ghz spectral results can be integrated to provide an estimate of combined jitter over a user-de? ned span. as both clocks and data signals can be observed, the ratio of data-to-clock jitter can be observed. the displayed jitter spectrum can also be altered through a user-de? ned transfer function, such as a speci? c pll frequency response. phase noise analysis is achieved via an external spreadsheet application run on a personal computer communicating to the 83496b/86108a through the 86100C mainframe (typically using a usb-gpib connection). an 83496a clock recovery module must be upgraded to a b version to function in the phase noise system. pll bandwidth/jitter transfer the on-board phase detector of the 83496b and 86108a allows for a precision measurement of phase-locked loop (pll) bandwidth, sometimes referred to as jitter transfer. the external software application discussed above for phase noise/jitter spectrum controls several jitter sources including the agilent n4903 jbert, 81150a function generator, n5182a mxg, or pattern generators/sources with delay line or phase modulation inputs (modulated with a 33250a function generator) to provide a modulated stimulus to the device under test (dut). the application will monitor the internal phase detector of the 83496b or 86108a to measure the stimulus as well as the dut response. by sweeping the frequency of the jitter stimulus, the ratio of the output jitter to the input jitter provides the pll bandwidth. the measurement system is extremely ? exible and can test input/outputs from 50 mb/s to 14.2 gb/s (data signals) and/or 25 mhz to 6.75 ghz (clock signals). thus several classes of duts can be measured including clock extraction circuits, multiplier/ dividers, and plls. similar to a phase noise analysis, this capability is achieved via an external application run on a pc. s-parameters and time domain re? ectometery/ time domain transmission (tdr/tdt) high-speed design starts with the physical structure. the transmission and re? ection properties of electrical channels and components must be characterized to ensure suf? cient signal integrity, so re? ections and signal distortions must be kept at a minimum. use tdr and tdt to optimize microstrip lines, backplanes, pc board traces, sma edge launchers and coaxial cables. analyze return loss, attenuation, crosstalk, and other s-parameters (including magnitude and group delay) with one button push using the 86100C option 202 enhanced impedance and s-parameter software, either in single- ended or mixed-mode signals. calibration techniques, unique to the 86100C, provide highest precision by removing cabling and ? xturing effects from the measurement results. translation of tdr data to complete single-ended, differential, and mixed mode s-parameters (including magnitude and group delay) are available through option 202 and the n1930a physical layer test system software. higher two-event resolution and ultra high-speed impedance measurements are facilitated through tdr pulse enhancers from picosecond pulse labs 1 . hdmi/displayport automated cable compliance test leveraging option 202, the 86100Cu-610 and 86100Cu- 620 hdmi/displayport cable compliance test software allow users to automate hdmi or displayport cable compliance tests using 54754a tdr module on the 86100C dca-j. the compliance software options offer an intuitive interface with step-by-step diagrammatic guidance yielding accurate results and detailed reports. pass/fail indicators allow r&d and qa customers to make repeatable compliant measurements without needing detailed knowledge of the speci? cs of either standard. n1024a tdr calibration kit the n1024a tdr calibration kit contains precision standard devices based on solt (short-open-load- through) technology to calibrate the measurement path. 1. picosecond pulse labs 4020 source enchancement module (www.picosecond.com)
8 measurements the following measurements are available from the tool bar, as well as the pull down menus. the available measurements depend on the dca-j operating mode. oscilloscope mode time rise time, fall time, jitter rms, jitter p-p, period, frequency, + pulse width, - pulse width, duty cycle, delta time, [tmax, tmin, tedgeremote commands only] amplitude overshoot, average power, v amptd, v p-p, v rms, v top, v base, v max, v min, v avg, oma (optical modulation amplitude) eye/mask mode nrz eye measurements extinction ratio, jitter rms, jitter p-p, average power, crossing percentage, rise time, fall time, one level, zero level, eye height, eye width, signal to noise, duty cycle distortion, bit rate, eye amplitude rz eye measurements extinction ratio, jitter rms, jitter p-p, average power, rise time, fall time, one level, zero level, eye height, eye amplitude, opening factor, eye width, pulse width, signal to noise, duty cycle, bit rate, contrast ratio mask test open mask, start mask test, exit mask test, filter, mask test margins, mask test scaling, create nrz mask advanced measurement options the 86100Cs software options allow advanced analysis. options 200, 201, and 300 require mainframe option 001. option 202 does not require option 86100-001. option 401 does not require options 001 and 200 unless a ddpws measurement is required. option 200 enhanced jitter analysis software measurements total jitter (tj), random jitter (rj), deterministic jitter (dj), periodic jitter (pj), data dependent jitter (ddj), duty cycle distortion (dcd), intersymbol interference (isi), sub-rate jitter (srj), asynchronous periodic jitter frequencies, subrate jitter components. data displays tj histogram, rj/pj histogram, ddj histogram, composite histogram, ddj versus bit position, bathtub curve (log or q scale) option 201 advanced waveform analysis measurements deep memory pattern waveform, user-de? ned measurements through matlab? interface, transmitter waveform dispersion penalty (twdp) data displays equalized waveform option 202 enhanced impedence and s-parameters option 300 amplitude analysis/rin/q-factor (requires option 200) measurements total interference (ti), deterministic interference (dual-dirac model, di), random noise (rn), periodic interference (pi), and inter-symbol interference (isi), rin (dbm or db/hz), q-factor data displays ti histogram, rn/pi histogram, isi histogram option 400 pll and jitter spectrum measurement software jitter spectrum/phase noise measurements integrated jitter: total jitter (tj), random jitter (rj),deterministic jitter (dj); dj amplitude/ frequency, jitter spectrum graph, jitter vs time graph, frequency vs time graph, jitterhistogram, post processed jitter measurements, phase noise graph dbc/hz vs frequency. phase locked loop (pll) measurements pll bandwidth, pll peaking, data rate, jitter transfer function (jtf) graph, observed jitter transfer (ojtf) graph, jtf model. option 401 advanced eye analysis jitter measurements total jitter (tj), random jitter (rj), deterministic jitter (dj), j2 jitter (j2), j9 jitter (j9), data dependent pulse width shrinkage (ddpws)* * requires 86100C-200 amplitude measurements total interference (ti), random noise (rn), deterministic interference (di), eye opening. mask test pass/fail status, ber limit. tdr/tdt mode (requires tdr module) quick tdr, tdr/tdt setup, normalize, response, rise time, fall time, time, minimum impedance, maximum impedance, average impedance, (single-ended and mixed-mode s-parameters with option 202)
9 additional capabilities standard functions standard functions are available through pull down menus and soft keys, and some functions are also accessible through the front panel knobs. markers two vertical and two horizontal (user selectable) tdr markers horizontal seconds or meter vertical volts, ohms or percent re? ection propagation dielectric constant or velocity limit tests acquisition limits limit test run until conditions off, # of waveforms, # of samples report action on completion save waveform to memory, save screen image measurement limit test specify number of failures to stop limit test when to fail selected measurement inside limits, outside limits, always fail, never fail report action on failure - save waveform to memory, save screen image, save summary mask limit test specify number of failed mask test samples report action on failure save waveform to memory, save screen image, save summary con? gure measurements thresholds 10%, 50%, 90% or 20%, 50%, 80% or custom eye boundaries de? ne boundaries for eye measurments de? ne boundaries for alignment format units for duty cycle distortion time or percentage extinction/contrast ratio ratio, decibel or percentage eye height amplitude or decibel (db) eye width time or ratio average power watts or decibels (dbm) top base de? nition automatic or custom time de? nition first edge number, edge direction, threshold second edge number, edge direction, threshold jitter mode units (time or unit interval, watts, volts, or unit amplitude) signal type (data or clock) measure based on edges (all, rising only, falling only) graph layout ( single, split, quad) quick measure con? guration 4 user selectable measurements for each mode, eye-mask, tdr etc.) default settings (eye/mask mode) extinction ratio, jitter rms, average power, crossing percentage default settings (oscilloscope mode) rise time, fall time, period, v amptd histograms con? gure histogram scale (1 to 8 divisions) histogram axis (vertical or horizontal) histogram window (adjustable window via marker knobs) math measurements 4 user-de? nable functions operator magnify, invert, subtract, versus, min, max source channel, function, memory, constant, response (tdr) calibrate all calibrations module (amplitude) horizontal (time base) extinction ratio probe optical channel front panel calibration output level user selectable C2v to 2v utilities set time and date remote interface set gpib interface touch screen con? guration/calibration calibration disable/enable touch screen upgrade software upgrade mainframe upgrade module
10 built-in information system the 86100C has a context-sensitive on-line manual providing immediate answers to your questions about using the instrument. links on the measurement screen take you directly to the information you need including algorithms for all of the measurements. the on-line manual includes technical speci? cations of the mainframe and plug-in modules. it also provides useful information such as the mainframe serial number, module serial numbers, ? rmware revision and date, and hard disk free space. there is no need for a large paper manual consuming your shelf space. file sharing and storage use the internal 40 gb hard drive to store instrument setups, waveforms, or screen images. a 256 mb usb memory stick is included with the mainframe. combined with the usb port on the front panel this provides for quick and easy ? le transfer. images can be stored in formats easily imported into various programs for documentation and further analysis. lan interface is also available for network ? le management and printing. an external usb dvd/cd-rw drive is available as an option to the mainframe. this enables easy installation of software applications as well as storage of large amounts of data. file security for users requiring security of their data, 86100C option 090 offers a removable hard drive. this also enables removal of the mainframe from secure environments for calibration and repair. powerful display modes use gray scale and color graded trace displays to gain insight into device behavior. waveform densities are mapped to color or easy-to-interpret gray shades. these are in? nite persistence modes where shading differentiates the number of times data in any individual screen pixel has been acquired. direct triggering through clock recovery typically an external timing reference is used to synchronize the oscilloscope to the test signal. in cases where a trigger signal is not available, clock recovery modules are available to derive a timing reference directly from the waveform to be measured. the agilent 83496a/b series of clock recovery modules are available for electrical, multimode optical, and single-mode optical input signals. 83496a/b modules have excellent jitter performance to ensure accurate measurements. each clock recovery module is designed to synchronize to a variety of common transmission rates. the 83496a/b can derive triggering from optical and electrical signals at any rate from 50 mb/s to 14.2 gb/s. the 86108a module incorporates the clock recovery capabilities of the 83496b into a module that also has sampling channels. since the clock recovery system is integrated with the samplers, measurements are achieved with a single instrument connection. clock recovery loop bandwidth the agilent clock recovery modules have adjustable loop bandwidth settings. loop bandwidth is very important in determining the accuracy of your waveform when measuring jitter, as well as testing for compliance. when using recovered clocks for triggering, the amount of jitter observed will depend on the loop bandwidth. as the loop bandwidth increases, more jitter is tracked out by the clock recovery resulting in less observed jitter. ? narrow loop bandwidth provides a jitter free system clock to observe a wide jitter spectrum ? wide loop bandwidth in some applications is speci? ed by standards for compliance testing. wide loop bandwidth settings mimic the performance of communications system receivers the 83496a/b and 86108a have a continuously adjustable loop bandwidth from as low as 15 khz to as high as 10 mhz, and can be con? gured as a golden pll for standards compliance testing.
11 waveform autoscaling autoscaling provides quick horizontal and vertical scaling of both pulse and eye-diagram (rz and nrz) waveforms. gated triggering trigger gating port allows easy external control of data acquisition for circulating loop or burst-data experiments. use ttl-compatible signals to control when the instrument does and does not acquire data. easier calibrations calibrating your instrument has been simpli? ed by placing all the performance level indicators and calibration procedures in a single high-level location. this provides greater con? dence in the measurements made and saves time in maintaining equipment. stimulus response testing using the agilent n490x berts error performance analysis represents an essential part of digital transmission test. the agilent 86100C and n490x bert have similar user interfaces and together create a powerful test solution. if stimulus only is needed, the 81133a and 81134a pattern generators work seamlessly with the 86100C. transitioning from the agilent 83480a and 86100a/b to the 86100C while the 86100C has powerful new functionality that its predecessors dont have, it has been designed to maintain compatibility with the agilent 86100a, 86100b and agilent 83480a digital communications analyzers and agilent 54750a wide-bandwidth oscilloscope. all modules used in the agilent 86100a/b, 83480a and 54750a can also be used in the 86100C. the remote programming command set for the 86100C has been designed so that code written for the 86100a or 86100b will work directly. some code modi? cations are required when transitioning from the 83480a and 54750a, but the command set is designed to minimize the level of effort required. ivi-com capability interchangeable virtual instruments (ivi) is a group of new instrument device software speci? cations created by the ivi foundation to simplify interchangeability, increase application performance, and reduce the cost of test program development and maintenance through design code reuse. the 86100C ivi-com drivers are available for download from the agilent website. vxii.2 and vxii.3 instrument control firmware revision 8.0 provides lan based instrument control
12 lowest intrinsic jitter the industry standard for lowest oscilloscope jitter was set with the development of the 86107a precision timebase reference module. mainframe jitter is reduced to levels below 200 fs. low oscilloscope jitter allows the true jitter performance of devices to be seen. oscilloscope jitter can be driven to even lower levels when using the 86108a precision waveform analyzer. precision timebase hardware has been integrated with the waveform sampling system to reduce residual jitter to less than 100 fs (< 60 fs typical!). the highest performance devices can be tested with pinpoint accuracy. the 86107a is used in tandem with any of the optical or electrical sampling modules to reduce mainframe trigger jitter. the 86108a includes sampling channels, internal clock recovery, and precision timebase hardware in a single module. the 86108a can derive a clock from the test signal and internally feed the precision timebase section. or an external timing reference can be provided to the precision timebase. ultra-low jitter is achieved in either 86108a con? guration. accurate views of your 40 gb/s waveforms when developing 40 gb/s devices, even a small amount of inherent scope jitter can become signi? cant since 40 gb/s waveforms only have a bit period of 25 ps. scope jitter of 1ps rms can result in 6 to 9 ps of peak-to-peak jitter, causing eye closure even if your signal is jitter-free. the agilent 86107a reduces the intrinsic jitter of 86100 family mainframes to the levels necessary to make quality waveform measurements on 40 gb/s signals. meeting your growing need for more bandwidth todays communication signals have signi? cant frequency content well beyond an oscilloscopes 3 db bandwidth. a high-bandwidth scope does not alone guarantee an accurate representation of your waveform. careful design of the scopes frequency response (both amplitude and phase) minimizes distortion such as overshoot and ringing. the agilent 86116c plug-in module includes an integrated optical receiver designed to provide the optimum in bandwidth, sensitivity, and waveform ? delity. it extends the bandwidth of the 86100C in? niium dca-j to 80 ghz electrical (93 ghz typical) and 65 ghz optical in the 1310 and 1550 nm wavelength bands. the 86117a and 86118a modules provide electrical bandwidths of 50 ghz and 70 ghz respectively. you can build a premier solution for 40 gb/s waveform analysis around the 86100C mainframe. performing return-to-zero (rz) waveform measurements an extensive set of automatic rz measurements are built-in for the complete characterization of return-to-zero (rz) signals at the push of a button. residual jitter of a 5 gb/s prbs signal showing the rj component at 67 fs, indicating the extremely low jitter level of the oscilloscope system
13 speci? cations speci? cations describe warranted performance over the temperature range of +10 c to +40 c (unless otherwise noted). the speci? cations are applicable for the temperature after the instrument is turned on for one (1) hour, and while self-calibration is valid. many pe rformance parameters are enhanced through frequent, simple user calibrations. characteristics provide useful, non-warranted information about the functions and performance of the instrument. characteristics are printed in italic typeface. product speci? cations and descriptions in this document subject to change without notice. factory calibration cycle -for optimum performance, the instrument should have a complete veri? cation of speci? cations once e very twelve (12) months. general speci? cations temperature operating non-operating altitude operating power 10 c to +40 c (50 f to +104 f) C40 c to +65 c (C40 f to +158 f) up to 4,600 meters (15,000 ft) 115 v, 5.7 a, 230 v, 3.0 a 50/60 hz weight mainframe without modules typical module mainframe dimensions (excluding handle) without front connectors and rear feet with front connectors and rear feet 15.5 kg (34 lb) 1.2 kg (2.6 lb) 215 mm h x 425 mm w x 566 mm d (8.47 in x 16.75 in x 22.2 in) 215 mm h x 425 mm w x 629 mm d (8.47 in x 16.75 in x 24.8 in) mainframe speci? cations horizontal system (time base) scale factor (full scale is ten divisions) minimum maximum delay 1 minimum maximum time interval accuracy 2 time interval accuracy C jitter mode operation 4 time interval resolution display units 2 ps/div (with 86107a: 500 fs/div) 1 s/div 24 ns 1000 screen diameters or 10 s, whichever is smaller 1 ps + 1.0% of ? time reading 3 or 8 ps, whichever is smaller 1 ps (screen diameter)/(record length) or 62.5 fs, whichever is larger bits or time (tdr modeCmeters) pattern lock 250 ns/div 40.1 ns default, 24 ns min 1000 screen diameters or 25.401 s, whichever is smaller vertical system (channels) number of channels vertical resolution full resolution channel adjustments record length 4 (simultaneous acquisition) 14 bit a/d converter (up to 15 bits with averaging) adjusts in a 1-2-5-10 sequence for coarse adjustment or ? ne adjustment resolution from the front panel knob scale, offset, activate ? lter, sampler bandwidth, attenuation factor, transducer conversion factors 16 to 16384 samples C increments of 1 1 time offset relative to the front panel trigger input on the instrument mainframe. 2 dual marker measurement performed at a temperature within 5 c of horizontal calibration temperature. 3 the maximum delay setting is 100 ns and delta time does not span across (28 + nx4)ns +/- 100ps delay setting, where n=0,1,2 .18. if delta time measurement span exceeds above criteria, time interval accuracy is 8 ps +0.1% of ? time reading 4 characteristic performance. test con? guration: prbs of length 2 7 C 1 bits, data and clock 10 gb/s.
14 1 the freerun trigger mode internally generates an asynchronous trigger that allows viewing the sampled signal amplitude witho ut an external trigger signal but provides no timing information. freerun is useful in troubleshooting external trigger problems. 2 the sampled input signal timing is recreated by using an externally supplied trigger signal that is synchronous with the sam pled signal input. 3 the dc to 100 mhz mode is used to minimize the effect of high frequency signals or noise on a low frequency trigger signal. 4 measured at 2.5 ghz with the triggering level adjusted for optimum trigger. 5 high sensitivity hysteresis mode improves the high frequency trigger sensitivity but is not recommended when using noisy, lo w frequency signals that may result in false triggers without normal hysteresis enabled. 6 slew rate 2v/ns mainframe speci? cations (continued) standard (direct trigger) option 001 (enhanced trigger) trigger modes internal trigger 1 external direct trigger 2 limited bandwidth 3 full bandwidth free run dc to 100 mhz dc to 3.2 ghz external divided trigger n/a 3 ghz to 13 ghz (3 ghz to 15 ghz) patternlock n/a 50 mhz to 13 ghz (50 mhz to 15 ghz) jitter characteristic maximum < 1.0 ps rms + 5*10e-5 of delay setting 4 1.5 ps rms + 5*10e-5 of delay setting 4 1.2 ps rms for time delays less than 100 ns 6 1.7 ps rms for time delays less than 100 ns 6 trigger sensitivity 200 m vpp (sinusoidal input or 200 ps minimum pulse width) 200 m vpp sinusoidal input: 50 mhz to 8 ghz 400 m vpp sinusoidal input: 8 ghz to 13 ghz 600 m vpp sinusoidal input: 13 ghz to 15 ghz trigger con? guration trigger level adjustment C1 v to + 1 v ac coupled edge select positive or negative n/a hysteresis 5 normal or high sensitivity n/a trigger gating gating input levels (ttl compatible) disable: 0 to 0.6 v enable: 3.5 to 5 v pulse width > 500 ns, period > 1 s gating delay disable: 27 s + trigger period + max time displayed enable: 100 ns trigger impedance nominal impedance re? ection connector type 50 10% for 100 ps rise time 3.5 mm (male) maximum trigger signal 2 v peak-to-peak
15 precision time base 86107a 1 86107a option 010 86107a option 020 86107a option 040 trigger bandwidth 2.0 to 15.0 ghz 2.4 to 25.0 ghz 2.4 to 48.0 ghz typical jitter (rms) 2.0 to 4.0 ghz trigger: < 280 fs 4.0 to 15.0 ghz trigger: < 200 fs 2.4 to 4.0 ghz < 280 fs 4.0 to 25.0 ghz < 200 fs 2.4 to 4.0 ghz < 280 fs 4.0 to 48.0 ghz < 200 fs time base linearity error < 200 fs input signal type synchronous clock 2 input signal level 0.5 to 1.0 vpp 0.2 to 1.5 vpp (typical functional performance) dc offset range 200 mv 3 required trigger signal-to-noise ratio 200 : 1 trigger gating disable: 0 to 0.6 v enable: 3.5 to 5 v pulse width > 500 ns, period > 1 s gating input levels (ttl compatible) trigger impedance (nominal) 50 connector type 3.5 mm (male) 3.5 mm (male) 2.4 mm (male) precision time base 86108a the 86108a can be triggered through clock recovery of the observed signal, through an external reference clock into the precisi on timebase section, or with the precision timebase operating on the clock signal recovered from the observed signal. the following speci? cations indicate the 86100 system timebase speci? cations achieved when using the 86108a plug-in module. (the 86100 mainframe and the 86108a mod ule can also be triggered with a signal into the mainframe. in this con? guration, the basic mainframe speci? cations are achieved) 86108a typical jitter (clock recovery and precision timebase con? guration) < 60 fs maximum jitter (clock recovery and precision timebase con? guration) 1 < 90 fs typical jitter (clock recovery without precision timebase active) < 1.25 ps effective trigger-to-sample delay (clock recovery and precision timebase con? guration, typical) < 200 ps typical jitter (trigger signal applied to precision timebase input) < 60 fs maximum jitter (trigger signal supplied to precision timebase input) 1 < 100 fs precision timebase trigger bandwidth 2 to 13.5 ghz ( 1 to 17 ghz ) precision timebase external reference amplitude characteristic 1.0 to 1.6 vpp precision timebase input signal type 2 sinusoid precision timebase maximum input level 2v (16 dbm) precision timebase maximum dc offset level 200 mv precision timebase input impedance 50 precision timebase connector type 3.5 mm male timebase resolution (with precision timebase active) 0.5 ps/div timebase resolution (precision timebase disabled) 2 ps/div 1 requires 86100 software revision 4.1 or above. 2 filtering provided for option 010 bands 2.4 to 4.0 ghz and 9.0 to 12.6 ghz, for option 020 9.0 to 12.6 ghz and 18 to 25.0 gh z, for option 40 9.0 to 12.6 ghz, 18.0 to 25.0 ghz, and 39.0 to 48.0 ghz. within the ? ltered bands, a synchronous clock signal should be provided (clock, sinusoid, bert trigger, etc.). outs ide these bands, ? ltering is required to minimize harmonics and sub harmonics and provide a sinusoid to the 86107 input. 3 for the 86107a with option 020, the agilent 11742a (dc block) is recommended if the dc offset magnitude is greater than 200 mv. 1 veri? ed with maximum level input signal (~800 mvpp) 2 the precision timebase performs optimally with a sinusoidal input. non-sinusoidal signals will operate with some degradation in timebase linearity.
16 ms-dos and windows xp pro are u.s. registered trademark of microsoft corporation. computer system and storage cpu mass storage 1 ghz microprocessor 40 gbyte internal hard drive optional external usb cd-rw drive operating system microsoft windows? xp pro display 1 display area active display area waveform viewing area entire display resolution graticule display resolution waveform colors persistence modes waveform overlap connect-the-dots persistence graticule grid intensity backlight saver dialog boxes 170.9 mm x 128.2 mm (8.4 inch diagonal color active matrix lcd module incorporating amorphous silicon tfts) 171mm x 128 mm (21,888 square mm) 6.73 in x 5.04 in (33.92 square inches) 103 mm x 159 mm (4.06 in x 6.25 in) 640 pixels horizontally x 480 pixels vertically 451 pixels horizontally x 256 pixels vertically select from 100 hues, 0 to 100% saturation and 0 to 100% luminosity gray scale, color grade, variable, in? nite when two waveforms overlap, a third color distinguishes the overlap area on/off selectable minimum, variable (100 ms to 40 s), in? nite on/off 0 to 100% 2 to 8 hrs, enable option opaque or transparent front panel inputs and outputs cal output trigger input usb 2 bnc (female) and test clip, banana plug apc 3.5 mm, 50 , 2 vpp base max rear panel inputs and outputs gated trigger input video output gpib rs-232 centronics lan usb 2 (2) ttl compatible vga, full color, 15 pin d-sub (female) 10 fully programmable, complies with ieee 488.2 serial printer, 9 pin d-sub (male) parallel printer port, 25 pin d-sub (female) 1 supports external display. supports multiple display con? gurations via windows? xp pro display utility. 2 usb keyboard and mouse included with mainframe. keyboard has integrated, 2-port usb hub.
17 module overview optical/electrical modules 750-1650 nm the 86105c has the widest coverage of data rates with optical modulation bandwidth of 9 ghz and electrical bandwidth of 20 ghz. the outstanding sensitivity (to C21 dbm) makes the 86105c ideal for a wide range of design and manufacturing applications. available ? lters cover all common data rates from 155 mb/s through 11.3 gb/s. the 86105d is the premier solution for optical waveform analysis for high-speed signals using short or long wavelength technologies. the optical receiver bandwidth exceeds 20 ghz and the electrical bandwidth exceeds 35 ghz, providing excellent waveform ? delity. switchable compliance ? lters are available at all common rates from 8.5 to 14.025 gb/s (16xfc). sensitivity to -12 dbm. 1000C1600 nm < 20 ghz optical and electrical channels: the 86105b module is optimized for testing long wavelength signals with up to 15 ghz of optical modulation bandwidth. each module also has an electrical channel with 20 ghz of bandwidth. the 86105b provides high pulse ? delity, sensitivity, and ? exible data rates. it is the recommended module for 10 gb/s compliance applications. 20 to 40 ghz optical and electrical channels: the 86106b has 28 ghz of optical modulation bandwidth with multiple 10 gb/s compliance ? lters, and has an electrical channel with 40 ghz of bandwidth. 40 ghz and greater optical and electrical channels: the 86116c is the widest bandwidth optical module with more than 65 ghz optical modulation bandwidth (1300 to 1620 nm) and more than 80 ghz electrical bandwidth. dual electrical modules 86112a has two low-noise electrical channels with > 20 ghz of bandwidth. 86117a has two electrical channels with up to 50 ghz of bandwidth ideal for testing signals up to 20 gb/s. 86118a has two electrical channels, each housed in a compact remote sampling head, attached to the module with separate light weight cables. with over 70 ghz of bandwidth, this module is intended for very high bit rate applications where signal ? delity is crucial. the 86108a has two electrical channels with over 32 ghz (typically 35 ghz) of bandwidth. clock recovery (similar to the 83496b) and a precision timebase (similar to the 86107a) are integrated into the module to provide the highest precision electrical waveform measurements. residual jitter can be < 60 fs and trigger to sample delay is effectively < 200 ps. clock recovery modules unlike real-time oscilloscopes, equivalent time sampling oscilloscopes like the 86100 require a timing reference or trigger that is separate from the signal being observed. this is often achieved with a clock signal that is synchronous to the signal under test. another approach is to derive a clock from the test signal with a clock recovery module. the 83496a and b provide the highest performance/ ? exibility as they are capable of operation at any data rate from 50 mb/s to 13.5 gb/s, (14.2 gb/s for 83496b 1 ) on single-ended anddifferential electrical signals, single- mode (1250 to 1620nm) and multimode (780 to 1330 nm) optical signals,with extremely low residual jitter. pll loop bandwidthis adjustable to provide optimal jitter ? ltering accordingto industry test standards. the 83496b has higher gain than the 83496a, allowing it to track most spread-spectrum signals. the 86108a module has internal clock recovery similar to the 83496b. time domain re? ectometry (tdr) the in? niium dca-j may also be used as a high accuracy tdr, using the 54754a differential tdr module. tdr/tdt analyses are commonly performed by signal- integrity (si) engineers during the design and validation of high-speed serial links and components. tdr/tdt measurements are also invaluable for maintaining consistent quality in printed circuit board (pcb) and passive-component manufacturing. the agilent n1021b tdr 18 ghz differential tdr probe kit connects printed circuit boards and other devices without connectors to the 54754a differential tdr/ tdt module in the 86100C in? niium dca-j wideband oscilloscope mainframe. in conjunction with these hardware components, engineers can use the optional 86100C-202 enhanced impedance and s-parameter software to accurately characterize differential impedances in the time- and frequency domains (for example, re? ections and impedances versus time or distance, or magnitude/phase/group delay of s-parameters like sdd11/sdd21). 1 requires 86100C ? rmware revision 8.1
18 86100 family plug-in module matrix the 86100 has a large family of plug-in modules designed for a broad range of data rates for optical and electrical waveforms. the 86100 can hold up to 2 modules for a total of 4 measurement channels. 1 module has receptacle to supply power for external probe. 2 pick any 4 rates (155 mb/s to 8.5 gb/s). 3 this module is not compatible with the 86100a and 86100b digital communication analyzer (dca) mainframes. if you would like to upgrade older dcas contact agilent technologies and ask for current trade-in deals. 4 the 86108a uses two module slots. filtered data rates 86105b 111 1 1 1000-1600 15 20 9 -12 112 1 1 1000-1600 15 20 9 -12 113 1 1 1000-1600 15 20 9 -12 86105c 100 2 1 1 750-1650 8.5 20 62.5 -20 200 1 1 750-1650 8.5 20 62.5 -16 300 2 1 1 750-1650 8.5 20 62.5 -16 86105d 1 1 750-1650 20 35 62.5 -12 86106b 1 1 1000-1600 28 40 9 -7 410 1 1 1300-1620 28 40 9 -7 86116c 1,3 1 1 1300-1620 65 80 9 -3 86116c 025 1 1 1300-1620 45 80 9 -10 86116c 040 1 1 1300-1620 65 80 9 -5 54785a 0 2 n/a 18 86112a 0 2 n/a 20 86117a 0 2 n/a 50 86118a 0 2 n/a 70 86108 3,4 02 n/a 32 mobile option no. of optical channels no. of electrical channels probe power 1 wavelength range (nm) un? ltered optical bandwidth (ghz) electrical bandwidth (ghz) fiber input (m) mask test sensitivity (dbm) 155 mb/s 622 mb/s 1063 mb/s 1244/1250 mb/s 2125 mb/s 2488/2500 mb/s 2.666 gb/s 3.125 gb/s 4.25 gb/s 5.00 gb/s 6.25 gb/s 8.50 gb/s 9.953 gb/s 10.3125 gb/s 10.51875 gb/s 10.664 gb/s 10.709 gb/s 11.096 gb/s 11.317 gb/s 14.025 gb/s 17.00 gb/s 25.80 gb/s 27.70 gb/s 39.813 gb/s 43.018 gb/s
19 1 smallest average optical power required for mask test. values represent typical sensitivity of nrz eye diagrams. assumes mas k test with complicance ? lter switched in. 2 cw refers to an unmodulated optical signal. module speci? cations: single-mode & multimode optical/electrical multiple and single-mode optical/electrical modules 86105b 86105c 86105d optical channel specifications optical channel un? ltered bandwidth 15 ghz 8.5 ghz (9 ghz) 20 ghz wavelength range 1000 to 1600 nm 750 to 1650 nm 750 to 1650 nm calibrated wavelengths 1310 nm/1550 nm 850 nm/1310 nm/1550 nm (20 nm) 850 nm/1310 nm/1550 nm optical sensitivity 1 C12 dbm 850 nm 2.666 gb/s, C20 dbm > 2.666 gb/s to 4.25 gb/s, C19 dbm > 4.25 gb/s to 11.3 gb/s, C16 dbm 1310 nm/1550 nm 2.666 gb/s, C21 dbm > 2.666 gb/s to 4.25 gb/s, C20 dbm > 4.25 gb/s to 11.3 gb/s, C17 dbm -11 dbm (850 nm) -12 dbm (1310/1550 nm) transition time (10% to 90% calculated from tr = 0.48/bw optical) 32 ps 56 ps 24 ps rms noise characteristic 5 w, (10 ghz) 12 w, (15 ghz) 850 nm 2.666 gb/s, 1.3 w > 2.666 gb/s to 4.25 gb/s, 1.5 w > 4.25 gb/s to 11.3 gb/s, 2.5 w 1310 nm/1550 nm 2.666 gb/s, 0.8 w > 2.666 gb/s to 4.25 gb/s, 1.0 w > 4.25 gb/s to 11.3 gb/s, 1.4 w 850 nm 8.5 to 11.3 gb/s, 10 w 14.025 gb/s, 16 w 310/1550 nm 8.5 to 11.3 gb/s, 5 w 14.025 gb/s, 8 w maximum 8 w, (10 ghz) 15 w (15 ghz) 850 nm 2.666 gb/s, 2.0 w > 4.25 gb/s to 11.3 gb/s, 4.0 w 1310 nm/1550 nm 2.666 gb/s, 1.3 w > 2.666 gb/s to 4.25 gb/s, 1.5 w > 4.25 gb/s to 11.3 gb/s, 2.5 w 850 nm 8.5 to 11.3 gb/s, 12 w 14.025 gb/s, 24 w 1310/1550 nm 8.5 to 11.3 gb/s, 7 w 14.025 gb/s, 12 w scale factor (per division) minimum 20 w 2 w 20 w maximum 500 w 100 w 500 mw cw 2 accuracy (single marker, referenced to average power monitor) 25 w 2% (10 ghz) 25 w 4% (15 ghz) 25 w 3% (single-mode) 25 w 10% (multimode) 25 w (2% (8/10 gb/s), 4%(14 gb/s) 6% un? ltered ) single-mode 25 w10% multimode cw offset range (referenced two divisions from screen bottom) +1 w to C3 w +0.2 w to C0.6 w +1w/-3w average power monitor (speci? ed operating range) C30 dbm to +3 dbm C30 dbm to 0 dbm -30 dbm to +3 dbm
20 module speci? cations: single-mode & multimode optical/electrical (continued) multiple and single-mode optical/electrical modules 86105b 86105c 86105d average power monitor accuracy single-mode 5% 100 nw connector uncer- tainty (20 to 30 c) 5% 200 nw connector uncertainty 5%200 nw connector uncertainty multimode (characteristic) n/a 10% 200 nw connector uncertainty 5% 200 nw connector uncertainty user calibrated accuracy single-mode 2% 100 nw power meter uncertainty, < 5 c change 3% 200 nw power meter uncertainty, < 5 c change 2% 100 nw power meter uncertainty multimode (characteristic) n/a 10% 200 nw power meter uncertainty, < 5 c change 10% 200 nw power meter uncertainty maximum input power maximum non-destruct average 2 mw (+3 dbm) 0.5 mw (C3 dbm) 5 mw (7 dbm) maximum non-destruct peak 10 mw (+10 dbm) 5 mw (+7 dbm) 10 mw (10 dbm) fiber input 9/125 m user-selectable connector 62.5/125 m 62.5/125 m user-selectable connector input return loss (hms-10 connector fully ? lled ? ber) 33 db 850 nm >13 db 1310 nm/1550 nm >24 db 27 db single-mode 14 db multimode electrical channel specifications electrical channel bandwidth 12.4 and 20 ghz 25 and 35 ghz transition time (10% to 90% calculated from tr = 0.35/bw) 28.2 ps (12.4 ghz) 17.5 ps (20 ghz) 14 ps (25 ghz) 10 ps (35 ghz) rms noise characteristic 0.25 mv (12.4 ghz) 0.5 mv (20 ghz) 0.25 mv (25 ghz) 0.5 mv (35 ghz) maximum 0.5 mv (12.4 ghz) 1 mv (20 ghz) 0.5 mv (25 ghz) 1 mv (35 ghz) scale factor (per division) minimum 1 mv/division maximum 100 mv/division dc accuracy (single marker) 0.4% of full scale 2 mv 1.5% of (reading-channel offset), 12.4 ghz 0.4% of full scale 2 mv 3% of (reading-channel offset), 20 ghz dc offset range (referenced to center of screen) 500 mv input dynamic range (relative to channel offset) 400 mv maximum input signal 2 v (+16 dbm) nominal impedance 50 re? ections (for 30 ps rise time) 5% electrical input 3.5 mm (male)
21 1 86116c requires an 86100C mainframe and software revision 7.0 or above. 2 fwhm (full width half max) as measured from optical pulse with 700 fs fwhm, 5 mhz repetition rate and 10 mw peak power. 3 smallest average optical power required for mask test. values represent typical sensitivity of nrz eye diagrams. assumes mas k test with compliance ? lter switched in. 4 contact agilent for broader wavelength speci? cations. module s optical/ e module speci? cations: single-mode optical/electrical high bandwidth single-mode optical/electrical modules 86106b 86116c1 optical channel specifications option 025 option 040 optical channel un? ltered bandwidth 28 ghz 45 ghz 65 ghz wavelength range 1000 nm to 1600 nm 1300n m to 1620 nm 4 calibrated wavelengths 1310 nm/1550 nm 1310 nm/1550 nm optical sensitivity C7 dbm 1310 nm C9 dbm (17 gb/s) C8 dbm (25.8 gb/s) C7 dbm (27.7 gb/s) C3 dbm (39.8/43.0 gb/s 1550 nm C10 dbm (17 gb/s) C9 dbm (25.8 gb/s) C8 dbm (27.7 gb/s) C5 dbm (39.8/43.0 gb/s) transition time (10% to 90% 18 ps 7.4 ps (fwhm)2 calculated from tr = 0.48/bw optical) rms noise characteristic 13 w (filtered) 23 w (un? ltered) 1310 nm 13 w (17 gb/s) 17 w (25.8 gb/s) 20 w (27.7 gb/s) 60 w (40 ghz) 54 w (39.8/43.0 gb/s) 75 w (55 ghz) 105 w (60 ghz) 187 w (65 ghz) 1550 nm 10 w (17 gb/s) 12 w (25.87 gb/s) 14 w (27.7 gb/s) 40 w (40 ghz) 36 w (39.8/43.0 gb/s) 50 w (55 ghz) 70 w (60 ghz) 125 w (65 ghz) maximum 15 w (filtered) 30 w (un? ltered) 1310 nm 18 w (17 gb/s) 20 w (25.8 gb/s) 30 w (27.7 gb/s) 120 w (40 ghz) 102 w (39.8/43.0 gb/s) 127 w (55 ghz) 225 w (60 ghz) 300 w (65 ghz) 1550 nm 15 w (17 gb/s) 18 w (25.8 gb/s) 21 w (27.7 gb/s) 80 w (40 ghz) 68 w (39.8/43.0 gb/s) 85 w (55 ghz) 150 w (60 ghz) 200 w (65 ghz)
22 1 86116c requires an 86100C mainframe and software revision 7.0 or above. 2 cw refers to an unmodulated optical signal. module speci? cations: single-mode optical/electrical (continued) high bandwidth single-mode optical/electrical modules 86106b 86116c 1 optical channel specifications continued scale factor minimum 20 w/division 200 w/division maximum 500 w/division 5 w/division cw 2 accuracy (single marker, reference to average power monitor) 50 w 4% of (reading-channel offset) 150 w 4% (reading-channel offset) cw offset range (referenced two divisions from screen button) +1 to C3 mw +8 to C12mw average power monitor (speci? ed operating range) C27 to +3 dbm -23 to +9 dbm factory calibrated accuracy user calibrated accuracy 5% 100 nw connector uncertainty, 20 to 30 c 2% 100 nw power meter uncertainty, < 5 c change maximum input power maximum non-destruct average 2 mw (+3 dbm) 10 mw (+10 dbm) maximum non-destruct peak 10 mw (+10 dbm) 50 mw (+17 dbm) fiber input 9/125 m, user-selectable connector input return loss (hms-10 connector fully ? lled ? ber) 30 db 20 db electrical channel specifications electrical channel bandwidth 18 and 40 ghz 80 (93) , 55 and 30 ghz transition time (10% to 90% calculated from tr = 0.35/bw ) 19.5 ps (18 ghz) 9 ps (40 ghz) 6.4 ps (55 ghz) 4.4 ps (80 ghz) rms noise characteristic 0.25 mv (18 ghz) 0.5 mv (40 ghz) 0.5 mv (30 ghz) 0.6 mv (55 ghz) 1.1 mv (80 ghz) maximum 0.5 mv (18 ghz) 1.0 mv (40 ghz) 0.8 mv (30 ghz) 1.1 mv (55 ghz) 2.2 mv (80 ghz) scale factor minimum 1 mv/division 2 mv/division maximum 100 mv/division dc accuracy (single marker) 0.4% of full scale 2 mv 1.5% of (reading- channel offset), 18 ghz 0.4% of full scale 2 mv 3% of (reading-channel offset), 40 ghz 0.4% of full scale 3 mv 2% of (reading- channel offset), 2% of offset (all bandwidths) dc offset range (referenced to center of screen) 500 mv input dynamic range (relative to channel offset) 400 mv maximum input signal 2 v (+16 dbm) nominal impedance 50 re? ections (for 20 ps rise time) 5% 10% (dc to 70 ghz) 20% (70 to 100 ghz) electrical input 2.4 mm (male) 1.85 mm (male)
23 module speci? cations: dual electrical dual electrical channel modules 86112a 54754a electrical channel bandwidth 12.4 and 20 ghz 12.4 and 18 ghz transition time (10% to 90% calculated from tr = 0.35/bw) 28.2 ps (12.4 ghz) 17.5 ps (20 ghz) 28.2 ps (12.4 ghz) 19.4 ps (18 ghz) rms noise characteristic 0.25 mv (12.4 ghz) 0.5 mv (20 ghz) 0.25 mv (12.4 ghz) 0.5 mv (18 ghz) maximum 0.5 mv (12.4 ghz) 1 mv (20 ghz) 0.5 mv (12.4 ghz) 1 mv (18 ghz) scale factor (per division) minimum 1 mv/division maximum 100 mv/division dc accuracy (single marker) 0.4% of full scale 2 mv 1.5% of (reading-channel offset), (12.4 ghz) 0.4% of full scale 2 mv 3% of (reading-channel offset) (20 ghz) 0.4% of full scale 2 mv 0.6% of (reading-channel offset), (12.4 ghz) 0.4% of full scale or marker reading (whichever is greater) 2 mv 1.2% of (reading-channel offset) (18 ghz) dc offset range (referenced from center of screen) 500 mv input dynamic range (relative to channel offset) 400 mv maximum input signal 2 v (+16 dbm) nominal impedance 50 re? ections (for 30 ps rise time) 5% electrical input 3.5 mm (male) dual electrical channel modules 86117a 86118a electrical channel bandwidth 30 and 50 ghz 50 and 70 ghz transition time (10% to 90% calculated from tr = 0.35/bw) 11.7 ps (30 ghz) 7 ps (50 ghz) rms noise characteristic 0.4 mv (30 ghz) 0.6 mv (50 ghz) 0.7 mv (50 ghz) 1.3 mv (70 ghz) maximum 0.7 mv (30 ghz) 1.0 mv (50 ghz) 1.8 mv (50 ghz) 2.5 mv (70 ghz) scale factor (per division) minimum 1 mv/division maximum 100 mv/division dc accuracy (single marker) 0.4% of full scale 2 mv 1.2% of (reading-channel offset), (30 ghz) 0.4% of full scale 2 mv 2% of (reading-channel offset), (50 ghz) 0.4% of full scale 2 mv 2% of (reading-channel offset), (50 ghz) 0.4% of full scale 2 mv 4% of (reading-channel offset), (70 ghz) dc offset range (referenced from center of screen) 500 mv input dynamic range (relative to channel offset) 400 mv maximum input signal 2 v (+16 dbm) nominal impedance 50 re? ections (for 30 ps rise time) 5% 20% electrical input 2.4 mm (male) 1.85 mm (male)
24 module speci? cations: dual electrical (continued) 86108a bandwidth 1 16 ghz and < 32 ghz, (35 ghz) transition time (10% to 90% calculated from tr = 0.35/bw) 10 ps rms noise characteristic 240 v (16 ghz) 420 v (32 ghz) maximum 350 v (16 ghz) 700 v (32 ghz) scale factor (per division) minimum 2 mv/division maximum 100 mv/division dc accuracy (single marker) 0.7% of full scale, 2 mv 1.5% of (reading-channel offset) (16 ghz) 0.7% of full scale, 2 mv 3% of (reading-channel offset) (32 ghz) cw offset range (referenced from center of screen) 500 mv input dynamic range (relative to channel offset) 400 mv maximum input signal 2 v (+16 dbm) nominal impedance 50 re? ections (for 30 ps rise time) 5% electrical input 3.5 mm (male) ch1 to ch2 skew < 12 ps clock recovery data rates input range continuous tuning 0.05 to 14.2 gb/s (requires fw revision 8.1 or higher) clock frequency input range continuous tuning 0.025 to 6.75 ghz minimum input level to aquire lock 175 m vpp minimum input level to aquire lock and achieve jitter speci? cations 125 m vpp recovered clock random jitter (used as internal trigger) 2 internal recovered clock trigger < 500 fs at 2 gb/s < 400 fs at 5 and 10 gb/s clock recovery adjustable loop bandwidth range (user selectable) 0.015 to 10 mhz clock recovery loop peaking range up to 4 settings (dependent on loop bw) loop bandwidth accuracy 30% tracking range (includes spread spectrum tracking) 2500 ppm 0.25% aquisition range 5000 ppm maximum consecutive identical digits to lock 150 auto relocking if signal lock is lost, system can automatically attempt to regain phase-lock. user selectable to enable/disable residual spread spectrum -72 3 db @ 33 khz front panel recovered clock amplitude 0.15 to 1.0 vpp (0.3 to 1.0 vpp) front panel recovered clock divide ratio (user selectable) 1, 2, 4, 8, 16 2, 4, 8, 16 recovered clock front panel connector type sma internal frequency counter accuracy 10 ppm 1 derived from time domain analysis. 2 this is not taking advantage of the 86108a precision timebase. with precision timebase enabled, system jitter approaches 60 fs for best performance.
25 tdr system tdr system (mainframe with 54754a module) oscilloscope/tdr performance normalized characteristics rise time 40 ps nominal < 25 ps normalized adjustable from larger of 10 ps or 0.08 x time/div maximum: 5 x time/div tdr step ? atness 1% after 1 ns from edge 5%, C3% < 1 ns from edge 0.1% low level high level 0.00 v 2 mv 200 mv +2 mv 86100C option 202 enhanced impedance and s-parameter software characteristics return loss attenuation return loss uncertainty C magnitude ghz db 3 2 1 0 C1 C2 6 db 6 db 12 db 12 db 20 db 20 db 26 db 26 db 3 6 9 12 16 return loss dynamic range C internal ghz db C20 C25 C30 C35 C40 C45 C50 C55 C60 16 avgs 64 avgs 256 avgs 0 3 6 9 12 16 return loss dynamic range C external ghz db C10 C20 C30 C40 C50 C60 16 avgs 64 avgs 256 avgs 0 4 8 12 16 20 24 28 32 attenuation uncertainty C magnitude ghz db 2 1 0 C1 C2 C3 6 db 6 db 12 db 12 db 20 db 20 db 30 db 30 db 40 db 40 db 3 6 9 12 16 attenuation dynamic range C internal ghz db C20 C25 C30 C35 C40 C45 C50 C55 C60 16 avgs 64 avgs 256 avgs 0 3 6 9 12 16 attenuation dynamic range C external ghz db C10 C20 C30 C40 C50 C60 16 avgs 64 avgs 256 avgs 0 4 8 12 16 20 24 28 32
26 86100C option 202 characteristics test conditions ? mainframe and module have been turned on for at least one hour and have been calibrated ? tdr calibration has been performed using n1024a ? internal measurements use 54754a as stimulus and either 54754a or 86112a as receiver ? external measurements use 54754a and picosecond pulse labs accelerator as stimulus and 86118a as receiver ? all characteristics apply to single-ended and differential ? derived from measurements of wide range of devices compared to vector network analyzer measurements ? averages of 256 except as noted in dynamic range phase uncertainty ? longer equipment warm-up times and careful calibration provide the best phase performance C perform module and tdr calibrations again if temperatures change ? phase uncertainty is the sum of the uncertainty from the desired graph plus the two additional components which are estimated below ? sampling points - s-parameters are determined from the sampling points record length 1 over the time interval, which is time per division multiplied by ten divisions. the reference plane is determined to nearest sampling point with uncertainty given by this equation: uncertainty in degrees = time per division (sec) * 10 divisions * f (hz) *360 (sampling points) 4096 * 2 simpli? ed version = time per division (sec) * f(hz) / 2.28 ? time base drift with temperature - the amount of drift can be observed by placing the calibration short at the reference plane and reading the amount of time difference in picoseconds. the phase uncertainty is given by this equation: uncertainty in degrees (temp drift) = time diff (sec) ?frequency (hz) * 360 performance characteristics for 86100C option 202 return loss attenuation 1 record length is user-de? ned from 16 to 16384 (? rmware 8.0 or above). however, the minimum record length used for s-parame ters is 4096, independent of user settings. return loss uncertainty C phase *see end notes for additional phase uncertainties ghz degrees 30 20 10 0 C10 C20 C30 6 db 6 db 12 db 12 db 20 db 20 db 26 db 26 db 3 6 9 12 16 attenuation uncertainty C phase *see end notes for additional phase uncertainties ghz degrees 30 20 10 0 C10 C20 C30 6 db 6 db 12 db 12 db 20 db 20 db 30 db 30 db 40 db 40 db 3 6 9 12 16
27 speci? cations 83496a/b-100 83496a/b-101 channel type differential or single-ended electrical single-mode or multimode optical, differential or single-ended electrical (no internal electrical splitters) data rates (divide by 2 for clock signals) standard: 50 mb/s to 7.1 gb/s continuous tuning option 200: 50 mb/s (14.2 gb/s for 83496b with ? rmware revision 8.1 or higher) option 201: 7.1 to 14.2 gb/s continuous tuning minimum inut level in aquire lock (voltage or oma 1 ) 150 m vpp single-mode (oma 1 ): C11 dbm @ 50 mb/s to 11.4 gb/s C8 dbm @ > 11.4 gb/s C12 dbm @ 7.1 gb/s to 14.2 gb/s (w/opt 200) C14 dbm @ 1 gb/s to 7.1 gb/s C15 dbm @ 50 mb/s to 1 gb/s multimode 1310 nm (oma 1 ): C10 dbm @ 50 mb/s to 11.4 gb/s C7 dbm @ > 11.4 gb/s C11 dbm @ 7.1 gb/s to 14.2 gb/s (w/opt 200) C13 dbm @ 1 gb/s to 7.1 gb/s C14 dbm @ 50 mb/s to 1 gb/s multimode 850 nm (oma 1 ): C8 dbm @ 50 mb/s to 11.4 gb/s C7 dbm @ > 11.4 gb/s C9 dbm @ 7.1 gb/s to 14.2 gb/s (w/opt 200) C11 dbm @ 1 gb/s to 7.1 gb/s C12 dbm @ 50 mb/s to 1 gb/s electrical: 150 m vpp output random jitter (rms) 2 internal recovered clock trigger < 500 fs 7.2 gb/s to 11.4 gb/s (300 fs @ 10 gb/s) < 700 fs 4.2 gb/s to 7.2 gb/s, 11.4 gb/s to 14.2 gb/s (400 fs @ 4.25 gb/s, 500 fs @ 2.5 gb/s) < 3 mui 50 mb/s to 4.2 gb/s (700 fs @ 1.25 gb/s) front panel recovered clock < 700 fs 7.2 gb/s to 11.4 gb/s (300 fs @ 10 gb/s) < 900 fs 4.2 gb/s to 7.2 gb/s, 11.4 gb/s to 14.2 gb/s (400 fs @ 4.25 gb/s, 500 fs @ 2.5 gb/s) < 4 mui 50 mb/s to 4.2 gb/s (700 fs @ 1.25 gb/s) clock recovery adjustable loop bandwidth range (user selectable) standard: 270 khz or 1.5 mhz 3 ; option 300: 15 khz to 10 mhz 4 continuous tuning (? xed value or a constant rate/n ratio) loop bandwidth accuracy standard: 30% option 300: 25% for transition density = 0.5 and data rate 155 mb/s to 11.4 gb/s (30% for 0.25 transition density 1.0 and all data rates) tracking range 2500 ppm 83496b, 1000 ppm 83496a aquisition range 5000 ppm internal splitter ratio 50/50 50/50 single-mode 30/70 multimode electrical signals have input only (no internal power dividers) input return loss 22 db (dc to 12 ghz) electrical 16 db (12 to 20 ghz) electrical 20 db single-mode, 16 db multimode 22 db min (dc to 12 ghz) electrical 16 db min (12 to 20 ghz) electrical input insertion loss 7.2 db max (dc to 12 ghz) electrical 7.8 db max (12 to 20 ghz) electrical 2.5 db max single-mode optical, 3 db max multimode optical (no electrical data output signal path) see footnotes on page 28.
28 speci? cations (continued) 83496a/b-100 83496a/b-101 electrical through-path digital amplitude attenuation 5 7.5 db (no electrical data output signal path) wavelength range 750 to 1330 nm multimode 1250 to 1650 nm single-mode electrical: 150 m vpp front panel recovered clock output amplitude 1 vpp max, 220 mvpp min, 300 mvpp consecutive identical digits (cid) 150 max front panel recovered clock output divide ratio (user selectable) 6 n=1 to 16 @ data rates 50 mb/s to 7.1 gb/s n=2 to 16 @ data rates 7.1 gb/s to 14.2 gb/s data input/output connectors 3.5 mm male fc/pc 7 9/125 m single-mode optical fc/pc 7 62.5/125 m multimode optical 3.5 mm male electrical (input only) front panel recovered clock output connector sma 1 to convert from oma to average power with an extinction ratio of 8.2 db use: pavgdbm = oma dbm C1.68 db. 2 veri? ed with prbs7 pattern, electrical inputs > 150 mvp-p and optical inputs > 3 db above speci? cation for minimum input level to acquire lock. output jitter veri? cation results of the 83496a/b can be affected by jitter on the input test signal. the 83496a/b will track jitter frequencies inside the loop bandwidth, and the jitter will appear on the recovered clock output. vertical noise (such as laser rin) on the input signal will be converted to jitter by the limit ampli? er stage on the input of the clock recovery. these effects can be reduced by lowering the loop bandwidth setting. 3 at rates below 1 gb/s, loop bandwidth is ? xed at 30 khz when option 300 is not installed. 4 without option 200 loop bandwidth is adjustable from 15 khz to 6 mhz. available loop bandwidth settings also depend on the data rate of the input signal. for transition density from 0.25 to 1, the loop bandwidth vs rate chart shows available loop bandwidth settings. higher loop bandwidths can be achieved when average data transition density is maintained at or above 50%. 5 20*log(vamp out /vamp in ) measured with prbs23 at 14.2 gb/s. 6 minimum frequency of divided front panel clock output is 25 mhz. 7 other types of optical connectors are also available. selectable loop bandwidth vs rate for 0.25 transition density 1 10.0e+3 100.0e+3 1.0e+6 10.0e+6 10.0e+6 100.0e+6 1.0e+9 10.0e+9 100.0e+9 input data rate (bits/s) loop bandwidth (hz) min max
29 ordering information 86100C in? niium dca-j mainframe 86100C-001 enhanced trigger 86100Cs-001 enhanced trigger upgrade kit 86100C-061 matlab - basic oscilloscope package 86100C-062 matlab - standard oscilloscope package 86100C-701 standard trigger (default) 86100C-090 removable hard drive 86100C-092 internal hard drive (default) 86100C-200 jitter analysis software 86100Cu-200 enhanced jitter analysis software upgrade 86100C-201 advanced waveform analysis software 86100Cu-201 advanced waveform analysis software upgrade 86100C-202 enhanced impedance and s-parameter software 86100Cu-202 enhanced impedance and s-parameter software upgrade 86100C-300 amplitude analysis/rin/q-factor 86100Cu-300 amplitude analysis/rin/q-factor upgrade 86100Cu-400 pll and jitter spectrum software 86100Cu-401 advanced eye analysis software 86100Cu-610 hdmi cable compliance test software 86100Cu-620 displayport cable compliance test software 86100C-afp module slot ? ller panel 86100C-ax4 rack mount ? ange kit 86100C-axe rack mount ? ange kit with handles 86100C-uk6 commercial cal certi? cate with test data n4688a external cd-rw drive note: options 200 and 201 require option 001 (enhanced trigger). option 300 requires options 200 and 001. option 400 and 401 require microsoft ? of? ce excel 2003/2007. option 401 requires options 001/200 for ddpws measurement. options 610 and 620 require a 54754a module and option 202 optical/electrical modules 86105b 15 ghz optical channel; single-mode, unampli? ed (1000 to 1600 nm) 20 ghz electrical channel 86105b-111 9.953, 10.3125, 10.51875, 10.664, 10.709, 11.096, 11.317 gb/s 86105b-112 155, 622 mb/s 2.488, 2.5, 2.666, 9.953, 10.3125, 10.51875, 10.664, 10.709, 11.096, 11.317 gb/s 86105b-113 1.063, 1.250, 2.125, 2.488, 2.5, 9.953, 10.3125, 10.51875, 10.664, 10.709, 11.096, 11.317 gb/s 86105c 9 ghz optical channel; single-mode and multimode, ampli? ed (750 to 1650 nm) 20 ghz electrical channel 86105c-100 155 mb/s through 8.5 gb/s (choose 4 ? lter rates from options 86105c-110 through 86105c-197) 86105c-110 155 mb/s 86105c-120 622 mb/s 86105c-130 1.063 gb/s 86105c-140 1.244/1.250 gb/s 86105c-150 2.125 gb/s 86105c-160 2.488, 2.500 gb/s 86105c-170 2.666 gb/s 86105c-180 3.125 gb/s 86105c-190 4.250 gb/s 86105c-193 5.0 gb/s 86105c-195 6.250 gb/s 86105c-197 8.500 gb/s 86105c-200 9.953, 10.3125, 10.519, 10.664, 10.709, 11.096, 11.317 gb/s 86105c-300 combination of rates available in 86105c-100 and 86105c-200 86105d 20 ghz optical channel; single-mode and multimode, (750-1650 nm); ? lters for 8.5, 9.953, 10.3125, 10.519, 10.664, 10.709, 11.096, 11.317, 14.025 gb/s; 35 ghz electrical channel 86106b 28 ghz optical channel; single-mode, unampli? ed (1000 to 1600 nm) 9.953 gb/s 40 ghz electrical channel 86106b-410 9.953, 10.3125, 10.664, 10.709 gb/s 86116c 1 40 to 65 ghz optical / 80 ghz electrical sampling module, 1300 to 1620 nm. select exactly one reference receiver option: 86116c-025: 40 ghz opt./80 ghz elec. channels, 17.0/25.8/27.7 gb/s reference receiver 86116c-040: 65 ghz opt./80 ghz elec. channels, 39.8/42.0 gb/s reference receiver this module is not compatible with the 86100a and 86100b dca mainframes. if you want to upgrade older dcas, contact agilent technologies to discuss current trade-in deals. all optical modules have fc/pc connectors installed on each optical port. other connector adapters available as options are: diamond hms-10, din, st and sc.
30 dual electrical channel modules 86112a dual 20 ghz electrical channels 86117a dual 50 ghz electrical channels 86118a dual 70 ghz electrical remote sampling channels 86118a-h01 differential de-skew tdr/tdt modules included with each of these tdr modules is a tdr demo board, programmers guide, two 50 sma terminations and one sma short. 54754a differential tdr module with dual 18 ghz tdr/electrical channels n1020a 6 ghz tdr probe kit n1021b 18 ghz differential tdr probe kit 83480ak02 static protection unit n1024a tdr calibration kit precision timebase module 86107a precision timebase reference module 86107a-010 2.5 and 10 ghz clock input capability 86107a-020 10 and 20 ghz clock input capability 86107a-040 10, 20 and 40 ghz clock input capability clock recovery modules the following modules provide a recovered clock from the data signal for triggering at indicated data rates: 83496a 50 mb/s to 7.1 gb/s clock recovery module 83496a-100 single-ended and differential electrical with integrated signal taps 83496a-101 single-mode (1250 to 1620 nm) and multimode (780 to 1330 nm) optical. integrated signal taps. single-ended or differential electrical inputs (no signal taps) 83496a-200 increase operating range to 50 mb/s to 14.2 gb/s 83496au-200 upgrade data rate 0.05 gb/s to 14.2 gb/s 83496a-300 add tunable loop bandwidth golden pll capability 83496au-300 upgrade adjustable loop bandwidth 83496b 50 mb/s to 7.1 gb/s clock recovery module. this module is not compatible with the 86100a and 86100b dca mainframes. if you want to upgrade older dcas, contact agilent technologies and ask for current trade-in deals. 83496b-100 single-ended and differential electrical with integrated signal taps 83496b-101 single-mode (1250 to 1620 nm) and multimode (780 to 1330 nm) optical. integrated signal taps. single-ended or differential electrical inputs (no signal taps) 83496b-200 increase operating range to 50 mb/s to 14.2 gb/s 83496bu-200 upgrade data rate 0.05 gb/s to 14.2 gb/s 83496b-201 shift operating range to 7.1 to 14.2 gb/s 83496bu-201 upgrade shift operating range to 7.1 to 14.2 gb/s 83496b-300 add tunable loop bandwidth golden pll capability 83496bu-300 upgrade adjustable loop bandwidth precision waveform analyzer module dual electrical channel module with integrated clock recovery and precision timebase. 86108a-100 dual 32 ghz electrical channels, integrated clock recovery (50 mb/s to 14.2 gb/s) with integrated precision timebase 86108a-001 two 3.5 mm phase trimmers for skew adjustment 86108a-002 two precision 3.5 mm 18 inch cables 86108a-003 two 3.5 mm 3 db attenuators 86108a-006 two 3.5 mm 6 db attenuators 86108a-010 two 3.5 mm 10 db attenuators 86108a-020 two 3.5 mm 20 db attenuators warranty options (for all products) r1280a customer return repair service r1282a customer return calibration service accessories 86101-60005 filler panel 0960-2427 usb keyboard (included with 86100C) 1150-7799 usb mouse (included with 86100C) 9300-1308 esd heel strap 9300-1367 esd wrist strap 9300-1484 esd desk mat 9300-0980 esd wrist strap ground cord optical connector adapters note: optical modules come standard with one fc/pc connector adapter 81000 ai diamond hms-10 connector 81000 fi fc/pc connector adapter 81000 si din connector adapter 81000 vi st connector adapter 81000 ki sc connector adapter rf/microwave accessories 11636b power divider, dc to 26.5 ghz, apc 3.5 mm 11636c power divider, dc to 50 ghz, 2.4 mm 11742a 45 mhz to 26.5 ghz dc blocking capacitor 11742a-k01 50 ghz dc blocking capacitor 8490d-020 2.4 mm 20 db attenuator 11900b 2.4 mm (f-f) adapter 11901b 2.4 mm (f) to 3.5 mm (f) adapter 11901c 2.4 mm (m) to 3.5 mm (f) adapter 11901d 2.4 mm (f) to 3.5 mm (m) adapter 5061-5311 3.5 mm (f-f) adapter 1250-1158 sma (f-f) adapter 1810-0118 3.5 mm termination 0960-0055 short 1250-1666 sma (f-f) adapter feedthru passive probe 54006a 6 ghz passive probe
in? niimax i active probes (1.5 to 7 ghz) note: the n1022a probe adapter is required to use these probes with the 86100 dca in? niimax i probe ampli? ers note: order 1 or more in? niimax i probe head or connectivity kit for each ampli? er 1130a 1.5 ghz probe amp 1131a 3.5 ghz probe amp 1132a 5 ghz iprobe amp 1134a 7 ghz probe amp in? niimax i probe heads e2675a in? niimax differential browser probe head and accessories. includes 20 replaceable tips and ergonomic handle. order e2658a for replacement accessories. e2676a in? niimax single-ended browser probe head and accessories. includes 2 ground collar assemblies, 10 replaceable tips, a ground lead socket and ergonomic browser handle. order e2663a for replacement accessories. e2677a in? niimax differential solder-in probe head and accessories. includes 20 full bandwidth and 10 medium bandwidth damping resistors. order e2670a for replacement accessories. e2678a in? niimax single-ended/differential socketed probe head and accessories. includes 48 full bandwidth damping resistors, 6 damped wire accessories, 4 square pin sockets and socket heatshrink. order e2671a for replacement accessories. e2679a in? niimax single-ended solder-in probe head and accessories. includes 16 full bandwidth and 8 medium bandwidth damping resistors and 24 zero ohm ground resistors. order e2672a for replacement accessories. in? niimax i connectivity kits (popular collections of the above probe heads) e2669a in? niimax connectivity kit for differential measurements e2668a in? niimax connectivity kit for single-ended measurements in? niimax ii active probes (10 to 13 ghz) note: the n1022a probe adapter is required to use these probes with the 86100 dca in? niimax ii probe ampli? ers note: order 1 or more in? niimax ii probe heads for each ampli? er. in? niimax i probe heads and connectivity kits can also be used but will have limited bandwidth. 1168a 10 ghz probe amp 1169a 13 ghz probe amp in? niimax ii probe heads n5380a in? niimax ii 12 ghz differential sma adapter n5381a in? niimax ii 12 ghz solder-in probe head n5382a in? niimax ii 12 ghz differential browser probe adapters n1022a adapts 113x/115x,/116x active probes to 86100 in? niium dca connectivity solutions hdmi n1080a h01 high performance coax based hdmi ? xture with plug (tpa-p) n1080a h02 high performance coax based hdmi ? xture with receptacle (tpa-r) n1080a h03 hdmi low frequency board sata note: these are available from comax technology, see www.comaxtech.com isata plug to sma C comax p/n h303000104 isata receptacle to sma C comax p/n h303000204 atca note: these are available from f9 systems, see www.f9-systems.com advanced tca tx/rx signal blade? advanced tca tx/rx bench blade? call agilent for connectivity and probing solutions not listed above. firmware and software firmware and software upgrades are available through the web or your local sales of? ce. www.agilent.com/? nd/dcaj 31
www.agilent.com/? nd/open agilent open simpli? es the process of connecting and programming test systems to help engineers design, validate and manufacture electronic products. agilent offers open connectivity for a broad range of system-ready instruments, open industry software, pc-standard i/o and global support, which are combined to more easily integrate test system development. www.agilent.com/? nd/emailupdates get the latest information on the products and applications you select. www.agilent.com/? nd/agilentdirect quickly choose and use your test equipment solutions with con? dence. agilent email updates agilent direct agilent open www.lxistandard.org lxi is the lan-based successor to gpib, providing faster, more ef? cient connectivity. agilent is a founding member of the lxi consortium. www.agilent.com www.agilent.com/? nd/dcaj for more information on agilent technologies products, applications or services, please contact your local agilent office. the complete list is available at: www.agilent.com/? nd/contactus americas canada (877) 894-4414 latin america 305 269 7500 united states (800) 829-4444 asia paci? c australia 1 800 629 485 china 800 810 0189 hong kong 800 938 693 india 1 800 112 929 japan 0120 (421) 345 korea 080 769 0800 malaysia 1 800 888 848 singapore 1 800 375 8100 taiwan 0800 047 866 thailand 1 800 226 008 europe & middle east austria 01 36027 71571 belgium 32 (0) 2 404 93 40 denmark 45 70 13 15 15 finland 358 (0) 10 855 2100 france 0825 010 700 germany 07031 464 6333 ireland 1890 924 204 israel 972-3-9288-504/544 italy 39 02 92 60 8484 netherlands 31 (0) 20 547 2111 spain 34 (91) 631 3300 sweden 0200-88 22 55 switzerland 0800 80 53 53 united kingdom 44 (0) 118 9276201 other european countries: www.agilent.com/? nd/contactus revised: october 1, 2008 product speci? cations and descriptions in this document subject to change without notice. ? agilent technologies, inc. 2009 printed in usa, june 1, 2009 5989-0278en remove all doubt our repair and calibration services will get your equipment back to you, performing like new, when promised. you will get full value out of your agilent equipment throughout its lifetime. your equipment will be serviced by agilent-trained technicians using the latest factory calibration procedures, automated repair diagnostics and genuine parts. you will always have the utmost confidence in your measurements. agilent offers a wide range of additional expert test and measurement services for your equipment, including initial start-up assistance, onsite education and training, as well as design, system integration, and project management. for more information on repair and calibration services, go to: www.agilent.com/find/removealldoubt

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